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Overview: This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research. The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems.
In this book, we present a novel approach to modeling digital circuits and systems by graphs, constituting structural decision diagrams jointly representing structural and functional information about digital circuits and systems. The model allows multilevel and hierarchical representation to cope with the complexity of systems. The primary objective and the novelty of the new model is enabling uniform and formal reasoning of cause-effect diagnostic relations between the faults and behavior of circuit components to support digital test and verification solutions.
The difficulties in developing analytical high-level and hierarchical cross-level approaches to test generation and fault analysis are related to missing suitable tools and models. The register transfer level models, instruction set architectures, dataflow charts or hardware description languages (HDL, VHDL, Verilog, System C) are not well suited for formal cause-effect reasoning and test generation, forcing engineers to settle for heuristic and approximate methods, which, as a rule, do not provide satisfactory solutions.
Genre: Non-Fiction > Tech & Devices
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