Download Nanometer-scale Defect by Pierre Richard Dahoo (.PDF)

Nanometer-scale Defect Detection Using Polarized Light by Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
Requirements: PDF Reader, 10,1 MB
Overview: This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
Genre: Non-Fiction, Science & Math

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